Wafer-Level Testing and Test During Burn-In for Integrated Circuits.

Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This...

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Bibliographic Details

Main Author:	Bahukudumbi, Sudarshan
Other Authors:	Chakrabarty, Krishnendu
Format:	Electronic eBook
Language:	English
Published:	Norwood : Artech House, 2010.
Subjects:	Integrated circuits > Testing. Integrated circuits > Wafer-scale integration. Semiconductors > Testing.
Online Access:	Full text (MFA users only)
ISBN:	9781596939905 1596939907 9781596939899 1596939893
Local Note:	ProQuest Ebook Central