Defects-recognition imaging and physics in semiconductors XIV : selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan /

This volume documents the latest understanding of many topics of current interest in the science and technology of defects in semiconductors. The investigation of defects in semiconductors is a little different to that in other fields of materials science: in order to observe defects in semiconducto...

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Bibliographic Details

Corporate Author:	International Conference on Defects: Recognition, Imaging and Physics in Semiconductors Miyazaki, Japan
Other Authors:	Yamada-Kaneta, Hiroshi, Sakai, Akira
Format:	Electronic Conference Proceeding eBook
Language:	English
Published:	Durnten-Zurich ; Enfield, N.H. : Trans Tech Publications, ©2012.
Subjects:	Semiconductors > Defects > Congresses. Image processing > Congresses.
Online Access:	Full text (MFA users only)
ISBN:	9783038138563 3038138568
ISSN:	0255-5476 ;
Local Note:	ProQuest Ebook Central