Scientific detection of fakery in art : 29-30 January 1998, San Jose, California /

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Bibliographic Details
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-Optical Instrumentation Engineers
Other Authors:	McCrone, Walter C., Chartier, Duane R., Weiss, Richard J. (Richard Jerome), 1923-
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : The Society, [1998]
Subjects:	Art > Forgeries > Congresses. Art > Expertising > Congresses. Art and science > Congresses.
ISBN:	0819427551
ISSN:	0277-786X ;

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Holdings details from Conservation
Call Number:	N8790 .S35 1998
	Available