Scientific detection of fakery in art : 29-30 January 1998, San Jose, California /

Saved in:
Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-Optical Instrumentation Engineers
Other Authors: McCrone, Walter C., Chartier, Duane R., Weiss, Richard J. (Richard Jerome), 1923-
Format: Book
Language:English
Published: Bellingham, Wash., USA : The Society, [1998]
Subjects:
ISBN:0819427551
ISSN:0277-786X ;
Description
Physical Description:v, 106 pages : illustrations, charts ; 28 cm.
Bibliography:Includes bibliographical references and index.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3315.
Library Staff:View instance in FOLIO